With the number of dots in the screen becoming larger,the period of writing data into OLED is certainly becoming longer.

在協(xié)調(diào)數(shù)據(jù)的寫入和讀取方式上,提出了一種雙節(jié)拍模式的控制驅(qū)動方法,即外設(shè)RAM設(shè)立雙套模式,兩套RAM交替對數(shù)據(jù)進行讀寫操作,并且采用兩組驅(qū)動芯片分奇偶列同時向屏寫數(shù)據(jù)。

The relation between threshold voltage and writing time,programming voltage,tunnel area and floating area is simulated.

介紹了 EEPROM的電學模型 ,模擬分析了閾值電壓變化與寫入時間、寫入電壓、隧道孔面積、浮柵面積的關(guān)系 。

Experimentally,diffraction efficiency of photon crystal lattice was measured in different read-in angle.

測定了雙光束耦合時不同入射角度光子晶格的衍射效率,實驗曲線表明,衍射效率隨寫入角度(光子晶格周期)的變化也有極大值存在,并且與數(shù)值模擬所對應(yīng)的角度是吻合的。

The examination,parameter read-in and the unit calibration of the combined meter board were implemented,suiting for kinds of digital instrument.

論述了系統(tǒng)設(shè)計中的幾個主要模塊,實現(xiàn)了組合儀表總成校驗、參數(shù)寫入及電路板檢測,該系統(tǒng)適合各類數(shù)字儀表檢測。